PDF Solutions uses advances in agentic AI to interpret complex datasets from CV test chips.
“Differentiated Data & Process Characterization. Our DirectScan system combines voltage contrast e-beam inspection with design layout analysis to help identify systematic failures inline before they occur. Our eProbe tool performs inline inspection designed to test over 60 trillion vias per year per tool and catch defects in increasingly three-dimensional structures. We have taken advantage of advances in agentic AI to also help make the tens of thousands of experiments and billions of measurements per wafer of our advanced CV test chips more accessible, including by enabling customers to interpret complex datasets and generate insights quickly on demand.”